In this white paper we have reviewed some of the basic concepts of DFY
including how process variations are classified and modeled, and how it is taken into account during the design process in the form of PVT corner analysis or Monte Carlo simulations. For 3 sigma designs, Monte Carlo is a viable solution but rapidly loses practicality for high sigma
designs, where ProPlus' NanoYield
- Deep dive into High Sigma Monte Carlo analysis. Different methods and their advantages/disadvantages.
- Introduction to ProPlus' high sigma technology licensed from IBM. Si-validated and in production use for 6+ years.
- Supports >7 sigma which is key for advanced nodes like FinFET.
- Supports >10K variables which is required for SRAM arrays and I/O circuits.